Exploring Design Space for Carbon Nanotube Transistor Flip-Flops Under Manufacturing Variations
This paper presents a novel approach to understanding and mitigating the impact of manufacturing imperfections on the performance of carbon nanotube field-effect transistor (CNTFET) flip-flops. The research introduces a topological failure mode taxonomy, which systematically categorizes how geometric variations introduced during the fabrication process can lead to circuit failures. This taxonomy serves as a foundation for a variation-aware design space exploration methodology. The goal is to identify optimal design parameters that enhance the robustness of CNTFET flip-flops against these inherent process-induced geometric perturbations. By considering these variations upfront, the study aims to improve the reliability and yield of CNTFET-based digital circuits. The findings are crucial for advancing the practical application of CNTFET technology in integrated circuits.
This research addresses a critical challenge in the practical implementation of advanced semiconductor technologies like CNTFETs: ensuring reliability amidst manufacturing variability. By developing a topological failure mode taxonomy and a variation-aware design methodology, the study provides a framework for engineers to proactively design circuits that are more resilient to process-induced geometric deviations. This systematic approach moves beyond traditional design methods by explicitly incorporating uncertainty from the outset. The long-term implication is the potential to accelerate the adoption of novel materials and device architectures by providing a clearer path to predictable performance and reduced fabrication costs, thereby fostering innovation in the semiconductor industry.
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